Quantification of interfacial trap states via bias-applied HAXPES: a chemical-state perspective
Source abstract
Abstract
Bias-applied HAXPES enables chemical-state-resolved quantification of interfacial trap states, highlighting their formation, localization, and dynamic voltage-dependent behavior.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Electrochemical Analysis and Applications · Analytical Chemistry and Sensors · Spectroscopy and Quantum Chemical Studies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemistry, National Taiwan University, Taipei, Taiwan
Center for Emergent Materials and Advanced Devices, National Taiwan University, Taiwan
Funding
National Science and Technology Council
References (20)
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