journal article·2006-09

High-temperature magnetoresistance study of a magnetic tunnel junction

D.C. Chen, Y.D. Yao, C.M. Chen, James Hung, Y.S. Chen, W.H. Wang, W.C. Chen, M.J. Kao

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Abstract

Abstract The thermal stability and the spin transportation phenomenon at room temperature and 140 ° C of a series of magnetic tunneling junctions with the structure of bottom electrode/PtMn/Pinned layer/ AlO x /CoFe/NiFe/top electrode have been investigated. The MR ratio decreases from 33.5% at room temperature to 29% at 140 ° C. The MR ratio at room temperature increases roughly 0.8% after thermal treatment at temperatures above 60 ° C. This is related to the thermal relaxation of the strains existing in the samples.
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OpenAlex topics: Magnetic properties of thin films

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References (10)

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