Track edges in metal-evaporated tape and thin metal-particle tape
Source abstract
Abstract
MFM images of tracks written in ME and MP tape have been obtained. The analysis of the images concentrated on the track edges. A track written with signals of 0.5 μm wavelength overwrites a part of a track written with a wavelength of 1 μm. The sharpness of the edges was derived from MFM results. It can be seen that the MP sample shows smaller changes in sharpness of the edge with an increasing write current than ME tape. In ME tape, the region between the λ=0.5 μm and the λ=1 μm parts of the track is much wider than the original λ=1 μm edge.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
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