In-situ characterization of Fe/FeN multilayer growth
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Magnetic properties of thin films · Copper Interconnects and Reliability · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. Baibich · Phys. Rev. Lett. · 1988 · 61 · 247210.1103/PhysRevLett.61.2472 ↗
2. Grundy · IEEE Trans. Magn. · 1989 · 25 · 362610.1109/20.42382 ↗
3. Parkin · Phys. Rev. Lett. · 1990 · 64 · 230410.1103/PhysRevLett.64.2304 ↗