The effect of Zn on the defects in sputter deposited Li–Zn ferrite films

Abstract In this paper we report the magnetization as a function of applied field at 300 K and magnetization as a function of temperature for several Li–Zn ferrite thin films with varying Zn content. A molecular field model has been used to fit the M vs. T data for both the thin film and the bulk. The magnetic properties of these thin films are found to be different from that of the bulk of similar composition. The difference is attributed to the presence of point defects, which leads to paraprocesses, thereby reducing the magnetization of the films.