Synthetic dynamic test of base line popping noise in recording heads

This paper examines the Base Line Popping Noise (BLPN) test that is used for inspection of instability and electrostatic discharge (ESD) related parameters. The conventional BLPN measurement is performed only by a dynamic tester and shown numerically. A novel BLPN method which is characterized by a synthetic dynamic test under static control is proposed. The results, compared with a conventional one, show that BLPN is thoroughly sensitive to examined parameters such as bias current, operating frequency and ESD zapping voltage. Some hysteresis loop clearly shows the occurrence of BLPN due to Barkhausen jumps which are undetectable by using a typical dynamic tester.