journal article·1996-03

XAFS studies of CoCr films

Isuke Ouchi, Ikuo Nakai, Hironobu Maeda

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Semiconductor materials and interfaces

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References (12)

Show source-provided references
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2. Sugita · IEEE Trans. Magn. · 1984 · 20 · 68710.1109/TMAG.1984.1063204 ↗
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4. Maeda · Jpn. J. Appl. Phys. · 1985 · 24 · L 95110.1143/JJAP.24.L951 ↗
5. Yoshida · J. Appl. Phys. · 1990 · 68 · 70510.1063/1.346802 ↗
6. Takei · Jpn. J. Appl. Phys. · 1993 · 32 · 226510.1143/JJAP.32.2665 ↗
7. Hono · J. Magn. Magn. Mater. · 1992 · 110 · L 25410.1016/0304-8853(92)90208-6 ↗
8. Sagoi · IEEE Trans. Magn. · 1986 · 22 · 133510.1109/TMAG.1986.1064495 ↗
9. Maeda · J. Magn. Soc. Jpn. · 1994 · 18 · 27
10. Ouchi · 1992 · 1 · 339
11. Ouchi · 1994 · 18
12. Kemner · IEEE Trans. Magn. · 1994 · 30 · 401710.1109/20.333975 ↗