journal article·1996-04

Interface roughness correlation in tungsten/silicon multilayers

M. Jergel, V. Holý, E. Majková, Š. Luby, R. Senderák

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Surface Roughness and Optical Measurements · Advanced Surface Polishing Techniques · Optical Coatings and Gratings

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

Show source-provided references
1. Brunel · J. Mater. Res. · 1993 · 8 · 260010.1557/JMR.1993.2600 ↗
2. Holý · Phys. Rev. B · 1994 · 49 · 1066810.1103/PhysRevB.49.10668 ↗
3. Sinha · Phys. Rev. B · 1988 · 38 · 229710.1103/PhysRevB.38.2297 ↗
4. Holý · Phys. Rev. B · 1993 · 47 · 1589610.1103/PhysRevB.47.15896 ↗
5. Jergel · J. Phys. D · 1995 · 28 · 24110.1088/0022-3727/28/4A/047 ↗
6. Spiller · J. Appl. Phys. · 1993 · 74 · 10710.1063/1.354140 ↗
7. M. Jergel, E. Majková, V. Holý, Š. Luby and R. Senderák, Mater. Sci. Forum, to be published.
8. Jergel · J. Physique IV · 1993 · 3 · 337