FMR study of Zr oxidation effect for amorphous Co77Zr23 thin film

Abstract Ferromagnetic resonance (FMR) experiments have been used to investigate the annealing effect about the surface magnetic properties for amorphous Co 77 Zr 23 thin film. At low-temperature annealing (150°C), high magnetization layer is newly formed under the surface by the oxidation effect of Zr and then the thickness of high magnetization layer increases with annealing temperature. Also, the thickness of the original concentration layer with increasing the annealing temperature is varied from 257 to 180 nm.