journal article·1993-09

Mössbauer spectroscopy, Rutherford backscattering spectrometry and X-ray diffraction studies of the interface structure of iron/metal multilayer films

M. Murayama, S. Nagata, K. Takahiro, R. Hanada, S. Yamaguchi

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Abstract

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Research context

OpenAlex topics: Magnetic properties of thin films · Magnetic Properties and Applications · Microstructure and mechanical properties

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References (9)

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