journal article·2009-08

Dehydrogenation at the Fe/Lu2O3 interface upon rapid thermal annealing

R. Mantovan, C. Wiemer, A. Lamperti, A. Zenkevich, Yu. Lebedinski, M. Fanciulli

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Abstract

Abstract The interfaces between ferromagnetic electrodes and tunnel oxides play a crucial role in determining the performances of spin-based electronic devices, such as magnetic tunnel junctions. Therefore, a deep knowledge of the structural, chemical, and magnetic properties of the buried interfaces is required. We study the influence of rapid thermal annealing treatments up to 500 °C on the interfacial properties of the Fe/Lu 2 O 3 system. As-grown stacks reveal the presence of hydrogenated Fe–Lu–H intermetallic phases at the Fe/Lu 2 O 3 interface most likely due to the H absorption on the Lu 2 O 3 surface upon exposure to air and/or to the oxide growth. The annealing treatments induce remarkable changes of the structural, chemical, and magnetic properties at the interface, as evidenced at the atomic scale by the sub-monolayer sensitivity of conversion electron Mossbauer spectroscopy. The use of complementary techniques such as X-ray diffraction, time-of-flight secondary ion mass spectrometry, and in situ X-ray photoelectron spectroscopy, confirms that the main effect of the annealing is to gradually promote the dehydrogenation at the Fe/Lu 2 O 3 interface.
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Research context

OpenAlex topics: Magnetic properties of thin films · Magnetic and transport properties of perovskites and related materials · Advanced Condensed Matter Physics

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