Sensitivity of Fresnel projection microscopy for observations of magnetic nano-particles
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Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Magnetic properties of thin films · Surface and Thin Film Phenomena
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References (4)
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1. Binh · Appl. Phys. Lett. · 1998 · 72 · 97510.1063/1.120614 ↗
2. Binh · Appl. Phys. Lett. · 1994 · 65 · 249310.1063/1.112648 ↗
3. Binh · Ultramicroscopy · 1998 · 73 · 10710.1016/S0304-3991(97)00143-5 ↗
4. Hirayama · Appl. Phys. Lett. · 1993 · 63 · 41810.1063/1.110011 ↗