journal article·2007-03

Hard X-ray and soft X-ray photoemission study of vanadium oxides

R. Eguchi, Y. Takata, M. Matsunami, K. Horiba, K. Yamamoto, M. Taguchi, A. Chainani, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, I.H. Inoue, S. Shin

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Abstract

Abstract We study the electronic structure of Mott–Hubbard systems SrVO 3 and CaVO 3 with photoemission spectroscopy (PES) using hard X-rays (HX) ( h ν ∼ 8 keV) and soft X-rays (SX) ( h ν ∼ 900 eV). In HX-PES results, the V 2p core levels of SrVO 3 and CaVO 3 show clear additional intensity, which are not observed in SX-PES. These features originate from bulk screening by coherent states at Fermi level as observed in other 3d transition metal oxides. From the comparison between SrVO 3 and CaVO 3 in HX-PES, the intensity in SrVO 3 is nearly similar to CaVO 3 . The results suggest screening from coherent states is more efficient in HX-PES compared to SX-PES.
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Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Condensed Matter Physics · Electron and X-Ray Spectroscopy Techniques

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References (12)

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