journal article·1983-03

Analysis of type-II magnetic contrast from ferromagnetic thin films in the scanning electron microscopy

T. Ikuta, R. Shimizu

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface Roughness and Optical Measurements · Advanced Electron Microscopy Techniques and Applications

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References (9)

Show source-provided references
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5. Newbury · Appl. Phys. Lett. · 1975 · 24 · 259
6. Shimizu · Japan. J. Appl. Phys. · 1976 · 15 · 96710.1143/JJAP.15.967 ↗
7. Jakubovics · Phys. Stat. Sol. (a) · 1978 · 46 · 29110.1002/pssa.2210460138 ↗
8. Yamamoto · Phil. Mag. · 1976 · 34 · 47910.1080/14786437608222037 ↗
9. Joy · Appl. Phys. Lett. · 1976 · 28 · 46610.1063/1.88801 ↗