Temperature dependence of electrical resistivity of Co/Cu multilayers at static magnetic field

Abstract Temperature dependence of the electrical resistivity has been measured below 50 K for the sputtered magnetic multilayers [Co(1.02 nm)/Cu( t Cu nm)] 25 with different Cu thickness at various magnetic fields. It is found that the electrical resistivities of ferromagnetic (FM) multilayer ( t Cu =0.76 nm) and the antiferromagnetic (AFM) one ( t Cu =1.05 nm) show temperature dependence of T 3/2 and T 2 , respectively. The slope, A ′, of each power law has a maximum near H s . The results imply that the magnetic fluctuation is a maximum near H s showing quantum phase transition.