journal article·2007-09

Structure-related effects on the domain wall migration in atomic point contacts

Maria Stamenova, Sudhakar Sahoo, Tchavdar N. Todorov, Stefano Sanvito

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Abstract

Abstract We investigate the interplay between magnetic and structural dynamics in magnetic point contacts under current-carrying conditions. In particular we address the dependence of the results upon the specific parameterization of the elastic properties of the material. Our analysis shows a strong influence of the structural relaxation on the energy barrier for domain wall migration, but a negligible dependence of the mechanical properties on the magnetic state. These results are stable against the various material specific choices of parameters describing different transition metals.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Molecular Junctions and Nanostructures · Magnetic properties of thin films · Semiconductor materials and devices

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References (4)

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1. Stamenova · Phys. Rev. B · 2006 · 73 · 09443910.1103/PhysRevB.73.094439 ↗
2. Rocha · Phys. Rev. B · 2004 · 70 · 09440610.1103/PhysRevB.70.094406 ↗
3. Stamenova · Phys. Rev. B · 2005 · 72 · 13440710.1103/PhysRevB.72.134407 ↗
4. Sutton · Philos. Mag. A · 2001 · 81 · 183310.1080/01418610108216639 ↗