Study of optical properties of metallic Au:SiO2 and Ni:SiO2 films
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and interfaces · Metal and Thin Film Mechanics · Copper Interconnects and Reliability
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References (10)
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10. Chen · Appl. Opt. · 1994 · 33 · 129910.1364/AO.33.001299 ↗