journal article·1996-04

Influence of the microstructure on the residual strains in (111) Au/Ni multilayers

O. Thomas, S. Labat, L. Barallier, A. Charaï, C. Alfonso, K. Badawi, B. Gilles, A. Marty

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Metal and Thin Film Mechanics · Semiconductor materials and interfaces · Copper Interconnects and Reliability

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (12)

Show source-provided references
1. Jankowski · J. Appl. Phys. · 1992 · 71 · 178210.1063/1.351214 ↗
2. Naik · Phys. Rev. B · 1995 · 51 · 354910.1103/PhysRevB.51.3549 ↗
3. Baker · 1994 · 343 · 555
4. S. Labat, B. Pichaud, O. Thomas, C. Alfonso, A. Charaï, L. Barrallier, B. Gilles and A. Marty, E-MRS 1995, Strasbourg, Thin Solid Films, to be published.
5. Flinn · IEEE Trans. Electron. Dev. · 1987 · 34 · 68910.1109/T-ED.1987.22981 ↗
6. Stoney · 1909 · 82 · 172
7. Baker · J. Mater. Res. · 1994 · 9 · 314510.1557/JMR.1994.3145 ↗
8. Ruud · J. Appl. Phys. · 1993 · 74 · 251710.1063/1.354692 ↗
9. Parkin · Appl. Phys. Lett. · 1991 · 58 · 271010.1063/1.104765 ↗
10. Badawi · Appl. Phys. Lett. · 1994 · 65 · 307510.1063/1.112510 ↗
11. Jonnard · J. Appl. Phys. · 1995
12. Bayle · 1994