Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers

journal article·1996-04

K. Temst, M.J. Van Bael, D.G. de Groot, N.J. Koeman, R.P. Griessen, B. Wuyts, C. Van Haesendonck, Y. Bruynseraede

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Abstract

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OpenAlex topics: Magnetic properties of thin films · nanoparticles nucleation surface interactions · Surface and Thin Film Phenomena

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Show source-provided references

1. Fullerton · Phys. Rev. B · 1992 · 45 · 929210.1103/PhysRevB.45.9292 ↗

2. Krim · Phys. Rev. Lett. · 1993 · 70 · 5710.1103/PhysRevLett.70.57 ↗

3. Fullerton · Phys. Rev. B · 1993 · 48 · 1743210.1103/PhysRevB.48.17432 ↗