Mössbauer investigation of FeTaN/TaN multilayer systems
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Abstract
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Research context
OpenAlex topics: Metal and Thin Film Mechanics · Copper Interconnects and Reliability · Semiconductor materials and devices
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References (6)
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1. Qiu · J. Appl. Phys. · 1994 · 75 · 693410.1063/1.356786 ↗
2. Li · J. Appl. Phys. · 1997 · 81 · 450110.1063/1.364930 ↗
3. S.X. Li, P.P. Freitas, S. Cardoso, J.C. Soares, B. Almeida, J.B. Sousa, unpublished.
4. Mosca · J. Appl. Phys. · 1990 · 67 · 751410.1063/1.345812 ↗
5. Cates · IEEE Trans. Magn. Mag. · 1993 · 29 · 310510.1109/20.280885 ↗
6. Takeshima · J. Appl. Phys. · 1993 · 73 · 657610.1063/1.352569 ↗