In situ layer-resolved magnetoelastic coupling and growth stress study of Co/Pd nanomultilayer films
Source abstract
Abstract
Abstract We report on the layer-by-layer evolution of growth stress and magnetoelastic coupling (MEC) constant for the (6-A Co/20-A Pd)6 nanomultilayer film. Stress in Pd sublayer shows tensile stress up to the second Pd sublayer deposition, and it gradually changes to compressive after the deposition of the third Pd sublayer. We witness that MEC constant continuously increases on increasing the Pd layer thickness from 0 to 20 A. It is found that the evolution of the MEC constant is intimately related to the film strain rather than interface formation, and second-order strain correction is crucial to describe the dependence of the MEC constant on the Pd thickness.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Metal and Thin Film Mechanics · Magnetic properties of thin films · Copper Interconnects and Reliability
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References (5)
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