journal article·1995-06

Structural and microstructural characterization in amorphous CoZrM (M = Zr, Nb, Ti) and CoZrPt thin films

F. Machizaud, M. Naili, G. Suran

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metallic Glasses and Amorphous Alloys · Magnetic properties of thin films · Magnetic Properties of Alloys

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

Show source-provided references
1. Suran · Phys. Rev. B · 1993 · 47 · 1500710.1103/PhysRevB.47.15007 ↗
2. Machizaud · Phys. Rev. B · 1989 · 40 · 58710.1103/PhysRevB.40.587 ↗
3. Naili · J. Appl. Phys. · 1994 · 7610.1063/1.357836 ↗
4. Suran · J. Appl. Phys. · 1988 · 63 · 431810.1063/1.340214 ↗
5. Suran · Phys. Rev. Lett. · 1986 · 57 · 310910.1103/PhysRevLett.57.3109 ↗
6. The as-determined value of Tcr is significantly lower than that deduced by differential scanning calorimetry or from resistivity measurements
7. Idrus · J. Phys. D · 1986 · 19 · 124510.1088/0022-3727/19/7/014 ↗
8. Pearson · 1964 · Vol. 4 · 519