journal article·1992-07

Ellipsometry of magnetron sputtered thin films of Ni, Si, AlN and Ni based multilayers

Petr Široký, Jaroslav Sobota, Lubomír Jastrabík

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Optical Coatings and Gratings · Semiconductor materials and interfaces · GaN-based semiconductor devices and materials

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References (12)

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