Ellipsometry of magnetron sputtered thin films of Ni, Si, AlN and Ni based multilayers
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Research context
OpenAlex topics: Optical Coatings and Gratings · Semiconductor materials and interfaces · GaN-based semiconductor devices and materials
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References (12)
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1. X-ray Multilayer for Diffractometers, Monochromators, and Spectrometers
2. Azam · 1977
3. Humlíček · 1990
4. J. Humlíček, Folia Facultatis Scientiarium Naturalium Universitatis Brunensis (to be published).
5. Lukeš · Phys. Stat. Sol. (a) · 1986 · 93 · 22310.1002/pssa.2210940126 ↗
6. Melles Griot's Optics Guide · 1988 · 4
7. Renner · 1991
8. 1985
9. Lynch · Solid State Commun. · 1971 · 9 · 219510.1016/0038-1098(71)90629-6 ↗
10. Hrdina · J. Modern Opt. · 1990 · 37 · 108710.1080/09500349014551121 ↗
11. Atkinson · J. Magn. Magn. Mater. · 1991 · 95 · 6110.1016/0304-8853(91)90215-V ↗
12. Atkinson · J. Magn. Magn. Mater. · 1991 · 95 · 6910.1016/0304-8853(91)90216-W ↗