Test of the domain wall model on ferromagnetic resonance in NiFe/NiO exchange biased films

Abstract Ferromagnetic resonance (FMR) is used to investigate NiFe/NiO samples exhibiting the exchange anisotropy effect characteristic of (FM)/(AF) bilayers. The data are interpreted with a model that includes a domain wall in the AF film parallel to the interface. Fit of the model to data yields the exchange-coupling field H E and an effective domain wall field H W , with H W consistently much larger than H E , indicating that the AF moments are relatively rigid in the polycrystalline NiO layer.