Separation of spin and orbital magnetizations in a samarium film

Abstract The L / S ratio of samarium has been determined by X-ray magnetic scattering from a thick epitaxial film, via the azimuthal dependence of the scattered intensity. This new method allows a direct determination of L / S in antiferromagnetic systems where charge scattering is not negligible at the position of the magnetic signal. The Russell–Saunders predictions fall within the accuracy of our results.