journal article·2006-09

Magnetization switching of NiFeSiB free layers for magnetic tunnel junctions

B.S. Chun, S.P. Ko, B.S. Oh, J.Y. Hwang, J.R. Rhee, T.W. Kim, S. Saito, S. Yoshimura, M. Tsunoda, M. Takahashi, Y.K. Kim

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Abstract

Abstract Ferromagnetic amorphous Ni 16 Fe 62 Si 8 B 14 layer have been studied as free layers for magnetic tunnel junctions (MTJs) to enhance cell switching performance. Traditional MTJ free layer materials such as NiFe and CoFe were also prepared for switching comparison purposes. Both NiFeSiB and NiFe resulted in an order of magnitude smaller switching fields compared to the CoFe. The switching field was further reduced for the synthetic antiferromagnetic NiFeSiB free layered structure.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Magnetic properties of thin films · Metallic Glasses and Amorphous Alloys · Magnetic Properties and Applications

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References (6)

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1. Moodera · Phys. Rev. Lett. · 1995 · 74 · 327310.1103/PhysRevLett.74.3273 ↗
2. Parkin · Nat. Mater. · 2004 · 3 · 86210.1038/nmat1256 ↗
3. Chun · Appl. Phys. Lett. · 2005 · 87 · 08250810.1063/1.2033128 ↗
4. Van den Berg · IEEE Trans. Magn. · 1997 · 165 · 524
5. K.R. Coffey, B.A. Gurney, D.E. Hein, H. Lefakis, D. Mauri, V.S. Speriosu, D.R. Wilhoit, US Patent 5583725, 1996.
6. Y. K. Kim, ISAMT/SOMMA 2005, WA-03-I, 2005.10.1055/s-2004-837288 ↗