journal article·1993-03

New optical devices for surface roughness measurements

T. Wielinga, J. Melissant

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Surface Roughness and Optical Measurements · Advanced Surface Polishing Techniques · Advanced Measurement and Metrology Techniques

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References (3)

Show source-provided references
1. Wierenga · IEEE Trans. Magn. · 1985 · MAG-21 · 138310.1109/TMAG.1985.1063969 ↗
2. Robinson · IEEE Trans. Magn. · 1985 · MAG-21 · 138610.1109/TMAG.1985.1064051 ↗
3. Wierenga · Wear · 1987 · 119 · 2910.1016/0043-1648(87)90096-2 ↗