Electrical transport in metallic thin films for giant magnetoresistance modelling purposes
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Abstract
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Research context
OpenAlex topics: Copper Interconnects and Reliability · Magnetic properties of thin films · Semiconductor materials and devices
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References (8)
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2. N. Persat, H.A.M. van den Berg, A. Dinia, in preparation.
3. N. Persat, H.A.M. van den Berg, A. Dinia, J. Magn. Magn. Mater. (1999) in preparation.
4. Sambles · Thin Solid Films · 1983 · 106 · 32110.1016/0040-6090(83)90344-9 ↗
5. van den Berg · J. Magn. Magn. Mater. · 1997 · 165 · 52410.1016/S0304-8853(96)00607-5 ↗
6. Persat · J. Appl. Phys. · 1997 · 81 · 474810.1063/1.365451 ↗
7. N. Persat, H.A.M. van den Berg, A. Dinia, Phys. Rev. B, submitted for publication.
8. E.H. Sondheimer, Adv. Phys. 1 (1952) 1. (Eqs. (15)–(19)).10.1080/00018735200101151 ↗