Microstructural analysis of Co/alloy/Cr multilayer thin-film media by transmission electron microscopy
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Abstract
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Research context
OpenAlex topics: Copper Interconnects and Reliability · Magnetic properties of thin films · Metal and Thin Film Mechanics
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References (9)
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1. Hata · IEEE Trans. Magn. · 1990 · 26 · 270910.1109/20.104846 ↗
2. Murdock · IEEE Trans. Magn. · 1990 · 26 · 270010.1109/20.104844 ↗
3. Yang · IEEE Trans. Magn. · 1991 · 27 · 505210.1109/20.278737 ↗
4. Min · IEEE Trans. Magn. · 1991 · 27 · 505810.1109/20.278739 ↗
5. Lambert · IEEE Trans. Magn. · 1990 · 26 · 270610.1109/20.104845 ↗
6. Kuwabara · J. Appl. Phys. · 1993 · 73 · 668610.1063/1.352502 ↗
7. Bravman · J. Elect. Microsc. Techn. · 1984 · 1 · 5210.1002/jemt.1060010106 ↗
8. Duan · J. Appl. Phys. · 1990 · 67 · 491310.1063/1.344729 ↗
9. Laughlin · IEEE Trans. Magn. · 1991 · 27 · 471310.1109/20.278924 ↗