Hall micromagnetometry of domain-wall depinning in Permalloy nanowires

Experimental results of field-induced domain-wall depinning in Permalloy nanowires of submicron width and thicknesses between 10 and 30 nm are presented. Single domain walls pinned at notches in nanowires are detected by Hall micromagnetometry. The technique allows to study domain-wall propagation and depinning non-invasively in the temperature range between 2 and 50 K. The influence of sample thickness on domain-wall propagation properties is investigated. In nanowires with two notches of different pinning strength single domain walls are pinned in a toggle mode. The temperature dependence of domain-wall depinning fields in two-notch wires is analyzed.