Structure and corrosion properties of Al/Si multilayers
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Abstract
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Research context
OpenAlex topics: Metal and Thin Film Mechanics · Copper Interconnects and Reliability · GaN-based semiconductor devices and materials
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References (3)
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1. Barbee · MRS Bulletin · 1990 · 15 · 1710.1557/S0883769400060413 ↗
2. Baibich · Phys. Rev. Lett. · 1988 · 61 · 247210.1103/PhysRevLett.61.2472 ↗
3. Shinjo · 1987