Measurements of the magnetoresistance effect in Co/Pt multilayers grown on patterned substrates
Source abstract
Abstract
Abstract Arrays of Pt and Polymethyl methacrylate (PMMA) orthogonal stripes were patterned on Si substrates by e-beam lithography. Co/Pt multilayers were deposited on these substrates, by e-beam evaporation. Scanning electron microscopy and atomic force microscopy images show that the multilayer growth maintains the patterned morphology. The magnetoresistance effect has been investigated in patterned and non-patterned multilayers at room temperature.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Magnetic properties of thin films · Anodic Oxide Films and Nanostructures · Surface and Thin Film Phenomena
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References (10)
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