A novel broadband measurement method for the magnetoimpedance of ribbons and thin films
Source abstract
Abstract
A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy multilayer thin film are presented and discussed.
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Source: openaire · Quality: needs review · Source record ↗
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Research context
OpenAlex topics: Magnetic Properties and Applications · Magnetic properties of thin films · Metallic Glasses and Amorphous Alloys
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References (4)
Show source-provided references
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