journal article·1980-04

Loss anomaly in plastically deformed 3% SiFe laminations

F. Fiorillo, P. Mazzetti, G. Montalenti, G.P. Soardo

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Thin-Film Transistor Technologies · Advanced Surface Polishing Techniques · Silicon and Solar Cell Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (9)

Show source-provided references
1. Shilling · IEEE Trans. Magn. MAG-10 · 1974 · 19510.1109/TMAG.1974.1058317 ↗
2. Nozawa · IEEE Trans. Magn. MAG-14 · 1978 · 25210.1109/TMAG.1978.1059767 ↗
3. Swift · IEEE Trans. Magn. MAG-12 · 1976 · 24410.1109/TMAG.1976.1059019 ↗
4. Mazzetti · IEEE Trans. Magn. MAG-14 · 1978 · 75810.1109/TMAG.1978.1059901 ↗
5. Qureshi · J. Appl. Phys. · 1970 · 41 · 104210.1063/1.1658808 ↗
6. Pry · J. Appl. Phys. · 1958 · 29 · 53210.1063/1.1723212 ↗
7. Young · IEEE Trans. Magn. MAG-10 · 1974 · 81410.1109/TMAG.1974.1058484 ↗
8. Celasco · Il Nuovo Cimento · 1974 · 23B · 37610.1007/BF02723644 ↗
9. Allia · J. Appl. Phys. · 1977 · 48 · 464910.1063/1.323528 ↗