Structural, morphological and magnetic study of CoPt/Cr/MgO films by energy dispersive X-ray diffractometry and reflectometry measurements

We report the results of joint energy dispersive X-ray diffraction and reflectometry studies of the structural and morphological characteristics of double layer CoPt/Cr thin films, deposited by pulsed laser deposition at various temperatures (T-dep = 25-500 degrees C) on (100) MgO substrates. The observed characteristics were correlated to the magnetic properties investigated by SQUID measurements.