Extracting media noise characteristics from MFM images
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OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
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References (7)
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4. X. Lin, R.C. Shi, Y. Luo, J.-G. Zhu, Presented at Intermag '98.
5. Glijer · IEEE Trans. Magn. · 1996 · 32 · 355710.1109/20.538689 ↗
6. Gliger · IEEE Trans. Magn. · 1996 · 32 · 355710.1109/20.538689 ↗
7. Grutter · Ultramicroscopy · 1992 · 47 · 39310.1016/0304-3991(92)90170-O ↗