Magnetostriction measurements with atomic force microscopy: a novel approach
Source abstract
Abstract
Abstract We present a new method for measuring magnetostriction with an atomic force microscope, adapted for the application of magnetic fields. We can measure magnetoelastic shifts as small as 5×10 −8 m, and since the technique is not only restricted to wires, we can also measure samples with linear dimensions
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Magnetic Properties and Applications · Surface and Thin Film Phenomena
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References (10)
Show source-provided references
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