Structural characterization of Au/Co multilayers by x-ray diffraction, x-ray reflectivity and glancing-incidence x-ray fluorescence
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · X-ray Spectroscopy and Fluorescence Analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. de Boer · Spectrochim. Acta B · 1991 · 46 · 132310.1016/0584-8547(91)80181-2 ↗
2. Proc. 4th Workshop TXRF
3. de Boer · Phys. Rev. B · 1991 · 44 · 49810.1103/PhysRevB.44.498 ↗
4. Sinha · Phys. Rev. B · 1988 · 38 · 229710.1103/PhysRevB.38.2297 ↗
5. Cullity · 1978