Causes of some errors in measurements in grain-oriented silicon-iron using the epstein square
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Magnetic Properties and Applications · Non-Destructive Testing Techniques · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (1)
Show source-provided references
1. Moses · Proc. IEE · 1977 · 124 · 413