Extrinsic contributions to FMR linewidth in Permalloy/X multilayers (X=Cu, CuAu)
Source abstract
Abstract
Abstract We report angular dependencies of ferromagnetic resonance linewidth in ultrathin layers of Permalloy (Py) in Py/X (X=Cu, CuAu) multilayers with various types of interlayer coupling. The increase in the linewidth with decrease in the coupling strength is observed. An anomalous behavior of Δ H in the vicinity of perpendicular configuration is explained as inhomogeneous broadening for nearly uncoupled stack of layers.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Magnetic properties of thin films · Copper Interconnects and Reliability · Magnetic Properties and Applications
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References (9)
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