Ambiguities on structure analysis of Fe–N thin films
Source abstract
Abstract
Abstract Fe–N thin films with good soft magnetic properties were prepared by RF sputtering and vacuum annealed at 250°C under 12000 A/m magnetic field for 4 h. The structure of α′ in thin films deposited at room temperature is different from α′ formed through the Bain mechanism in bulk samples. In thin films, the lattice parameters of α′ are c=2.866+1.559 C N α ′ ,a=2.864+0.181 C N α ′ .
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Research context
OpenAlex topics: Magnetic Properties and Applications · Magnetic properties of thin films · Copper Interconnects and Reliability
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References (11)
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