Statistical properties of currents flowing through tunnel junctions
Source abstract
Abstract
This paper presents an overview of the statistical properties arising from the broadness of the distribution of tunnel currents in metal-insulator-metal tunnel junctions. Experimental current inhomogeneities can be modelled by a lognormal distribution and the size dependence of the tunnel current is modified at small sizes by the effect of broad distributions.
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Research context
OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Quantum and electron transport phenomena · Semiconductor materials and interfaces
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References (30)
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