X-ray magnetic circular dichroism in Fe/NiO thin films

A.D. Alvarenga; F. Garcia; L.C. Sampaio; C. Giles; F. Yokaichiya; C.A. Achete; R.A. Simão; A.P. Guimarães

doi:10.1016/s0304-8853(01)00231-1

journal article·2001-07

X-ray magnetic circular dichroism in Fe/NiO thin films

A.D. Alvarenga, F. Garcia, L.C. Sampaio, C. Giles, F. Yokaichiya, C.A. Achete, R.A. Simão, A.P. Guimarães

Journal of Magnetism and Magnetic Materials· Volume 233· Issue 1-2

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Abstract

Abstract The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were removed by “in situ” sputtering, followed by XMCD measurements, resulting in a depth profile. A decrease from the bulk value in the value of the Fe moment at the interface of Fe with the antiferromagnetic NiO(1 0 0) was observed.

Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Magnetic properties of thin films · Magnetic Properties and Applications · Non-Destructive Testing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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