Dichroic imaging of magnetic domains with a scanning near-field optical microscope
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Abstract
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Research context
OpenAlex topics: Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications
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References (6)
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4. Nakamura · J. Appl. Phys. · 1995 · 77 · 77910.1063/1.359000 ↗
5. Chen · Ultramicroscopy · 1996 · 61 · 25310.1016/0304-3991(95)00145-X ↗
6. Ploessel · J. Appl. Phys. · 1993 · 74 · 743110.1063/1.354964 ↗