Influence of the antiferromagnetic grain volume distribution on exchange-bias in polycrystalline thin films: An X-ray diffractometry study
Source abstract
Abstract
Abstract In this paper we present a model to calculate exchange-bias and coercive fields in a prototype exchange-bias layer system using the in-plane and out-of-plane grain size distributions of the polycrystalline antiferromagnet measured non-destructively by X-ray diffraction and the magnetic history of the exchange-bias system. The model is checked by comparing the computed values with measured ones considering a constant average magnetic anisotropy energy density for all samples and the average exchange coupling energy area density as a parameter for the calculation.
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Research context
OpenAlex topics: Magnetic properties of thin films · Magnetic Properties and Applications · Theoretical and Computational Physics
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References (56)
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