Optimization of data storage density and data media quality monitoring in film storage thermal recording devices
Source abstract
Abstract
The new method for express analysis of the film's thermophysical characteristics is presented. On the basis of this method an original approach to optimization of the data recording on CD is proposed. The method has high sensitivity and allows using standard devices for CD quality monitoring and also for film or other coating adhesion to the substrate.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Advanced Sensor Technologies Research · Adhesion, Friction, and Surface Interactions
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References (5)
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