Effect of Cu thickness in Co/Cu multilayers on polar and longitudinal magneto-optical Kerr spectra

J. Mistrik; R. Krishnan; S. Visnovsky; N. Keller; A. Biondo; A. Franca de Souza; A.A. Mello; E.M. Baggio-Saitovitch

doi:10.1016/s0304-8853(01)00836-8

journal article·2002-02

Effect of Cu thickness in Co/Cu multilayers on polar and longitudinal magneto-optical Kerr spectra

J. Mistrik, R. Krishnan, S. Visnovsky, N. Keller, A. Biondo, A. Franca de Souza, A.A. Mello, E.M. Baggio-Saitovitch

Journal of Magnetism and Magnetic Materials· Volume 240· Issue 1-3

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Source abstract

Abstract

Sputtered Co/Cu multilayers were studied by means of magneto-optical (MO) Kerr spectroscopy. Remarkable changes in the MO spectra were observed for the multilayers where antiferromagnetic coupling take place. This may indicate the changes in the electronic properties of Cu layers. The optical nature of this MO behaviour was verified by ellipsometric measurements.

Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Magnetic properties of thin films · Copper Interconnects and Reliability · Semiconductor materials and interfaces

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

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