Investigations of magnetic microstructures using scanning electron microscopy with spin polarization analysis
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Magnetic properties of thin films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. Koike · J. Appl. Phys. · 1985 · 57 · 424410.1063/1.334627 ↗
2. Celotta · 1982 · 4212
3. DiStefano · IBM Tech. Discl. Bull. · 1978 · 20 · 4212
4. Kirschner · Appl. Phys. A · 1985 · 36 · 12110.1007/BF00624930 ↗
5. Unguris · Phys. Rev. Lett. · 1982 · 49 · 7210.1103/PhysRevLett.49.72 ↗
6. Landolt · Phys. Rev. Lett. · 1982 · 49 · 178310.1103/PhysRevLett.49.1783 ↗
7. Hopster · Phys. Rev. Lett. · 1983 · 50 · 7010.1103/PhysRevLett.50.70 ↗
8. Koike · Japan. J. Appl. Phys. · 1985 · 24 · L54210.1143/JJAP.24.L542 ↗
9. Chikazumi · J. Phys. Soc. Japan · 1955 · 10 · 52310.1143/JPSJ.10.523 ↗