Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering

V.G. Kostishin; A.Yu. Mironovich; R.I. Shakirzyanov; I.M. Isaev; A.V. Timofeev; A.I. Ril; P.V. Lega

doi:10.1016/j.jmmm.2021.167786

journal article·2021-06

Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering

V.G. Kostishin, A.Yu. Mironovich, R.I. Shakirzyanov, I.M. Isaev, A.V. Timofeev, A.I. Ril, P.V. Lega

Journal of Magnetism and Magnetic Materials· Volume 527

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Source abstract

Abstract

Abstract Barium hexaferrite thin films were prepared by ion beam deposition on sapphire (1 0 2) single crystal substrates. The structural properties of the films were analyzed by means of X-ray diffraction, atomic force microscopy, magnetic force microscopy and scanning electron microscopy. The obtained results were interpreted as a presence of layered structure with different types of texture and its formation mechanism is proposed. The significant influence of BaFe12O19 thickness on its microstructure was observed. Films obtained under certain conditions are potentially fit for further growing of oriented hexaferrite with out-of-plane orientation of c-axis.

Source: openaire · Quality: candidate unverified · Source record ↗

Research context

Materials processing

OpenAlex topics: Magnetic Properties and Synthesis of Ferrites · Magnetic Properties and Applications · Electromagnetic wave absorption materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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