journal article·2007-09

Testing parameters of TMR heads affected by dynamic-tester induced EMI

A. Kruesubthaworn, R. Sivaratana, V. Ungvichian, A. Siritaratiwat

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Abstract

Abstract A variety of expected electromagnetic interference (EMI) sources of both radiated and conducted EMI emissions produced by a dynamic tester is studied. It is determined that the power cable connector of the robot arm radiates a significant electric field (E-field) of about 197 V/m at 1 foot away and an estimated calculation of the E-field of about 212 mV/m is at the spindle motor. These fields can be attenuated by about 20–30 dB when using a copper lined Faraday's cage. Furthermore, the study has revealed that the radiated EMI plays a more significant role than the conducted EMI. In addition, it is determined that out of seven selected testing parameters, the SGAW is rather more sensitive to EMI than conventional failure parameters, especially static glitche during the write cycle.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Electromagnetic Compatibility and Noise Suppression · Electrical Contact Performance and Analysis · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (2)

Show source-provided references
1. Kraz · Electrostat. Rev. · 2002 · 54 · 3910.1016/S0304-3886(01)00163-2 ↗
2. Siritaratiwat · Trans. Magn. Soc. Japan. Rev. · 2005 · 5 · 11710.3379/tmjpn2001.5.117 ↗